18th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF-2019)

Invited Speakers

• Laura Borgese, University of Brescia, Italy
  “European Network for chemical elemental analysis by total reflection X-ray fluorescence”

• Sangita Dhara, Bhabha Atomic Reserch Center, India
  “TXRF for elemental characterization of nuclear materials: Some recent studies”

• Ramón Fernández, Autonomous University of Madrid, Spain
  “Considerations about the effect of chemical atomic surrounding in the quantitative analysis by TXRF”

• Jun Kawai, Kyoto University, Japan
  “TXRF and polarized XRF spectrometer with 3D printer”

• Galina Pashkova, Siberian Branch of the Russian Academy of Sciences, Russia
  “Characterization of sediment composition by TXRF: Tips and tricks”

• Giancarlo Pepponi, Fondazione Bruno Kessler, Italy
  “Arrays of linear, energy dispersive x-ray detectors for combined fluorescence and scattering characterization”

• Sofia Pessanha, Universidade Nova de Lisboa, Portugal
  “Comparison of TXRF and portable EDXRF system with triaxial geometry in the analysis of contaminated waters”
• Pawel Wrobel, AGH University of Science and Technology, Poland
  “Challenges of trace element analysis of human samples”

To be defined soon